This project addresses a critical challenge in semiconductor manufacturing: automated detection of linear scratch patterns and "ink dies" (good dies within scratches) on silicon wafers. The solution ...
Abstract: Wafermap defect pattern detection and diagnosis provide useful clue to yield learning. However, most wafermaps have no special spatial patterns and are full of noises, which make pattern ...
Tartan pattern seamless of vector check plaid with a texture background fabric textile. Tartan pattern seamless of vector check plaid with a texture background fabric textile in purple and light ...
Royalty-free licenses let you pay once to use copyrighted images and video clips in personal and commercial projects on an ongoing basis without requiring additional payments each time you use that ...
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