Abstract: We describe a new approach to test generation and test compaction for scan circuits that eliminates the distinction between scan operations and application of primary input vectors. Under ...
Abstract: It is demonstrated that it is possible to generate a deterministic test set that detects all the detectable single stuck-at faults in a full-scan circuit such that each test vector contains ...
Over the past years we at CircuitDigest have built a ton of electronics projects and tutorials to help our community to learn and build electronics with ease. Recently we have noticed a huge interest ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback