The 2006 International Test Conference is scheduled for the week of October 22 in Santa Clara, CA. For more on this year’s ITC, read our interview with program chair Anne Gattiker. Semiconductor test ...
Abstract: RF systems that directly interface between digital bits and RF front-ends are rapidly gaining interest as the number of transceivers in mobile systems is increasing. This tutorial will ...
Abstract: In this paper, a novel built-in tuning technique to compensate for process variability-induced imperfections in RF circuits is proposed. The yield improvement methodology proposed is a ...
SPICE has been the mainstay tool for analog and RF designers for over 25 years. During that time, analog- and RF-circuit complexity has grown by several orders of magnitude while circuit geometries ...