Driven by the need to objectively measure the progress of their verification efforts and the contributions of different verification techniques, IC designers have adopted coverage as a metric. However ...

The semiconductor industry has greatly simplified analysis by consolidating around a small number of models and abstractions, but that capability is breaking down both at the implementation level and ...

Taiwanese Journal of Mathematics, Vol. 14, No. 3A, Special Issue: Recent Advances in Numerical Methods for Eigenvalue Problems (June 2010), pp. 855-867 (13 pages) In the present paper, we consider a ...