SANTA ROSA, Calif.--(BUSINESS WIRE)-- Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...

October 22, 2012. Keithley Instruments Inc. has introduced seven instrumentation, software, and test-fixture configurations for parametric curve-tracing applications for characterizing high-power ...

Insurance is one of the few industries that have remained largely unchanged over the past few decades at a low level: You suffer losses as a direct result of something going south, and you get paid by ...

Targeting characterization of communications and high-speed digital devices at the wafer level, the Model S600DC/RF APT (automated parametric test) system from Keithley Instruments (Cleveland, OH, www ...

A K-sample testing problem is studied for multivariate counting processes with time-dependent frailty. Asymptotic distributions and efficiency of a class of non-parametric test statistics are ...

Parametric features are becoming more common in FEA packages. Parametric features are becoming more common in FEA packages. The key benefit of parametric features is that they let users see the ...

This is a preview. Log in through your library . Abstract We present a novel family of non-parametric omnibus tests of the hypothesis that two unknown but estimable functions are equal in distribution ...