REFV AFMIR enhances nanoscale characterization, offering simultaneous chemical and mechanical insights with high spatial resolution and reduced lateral forces.

This article compares Atomic Force Microscopy-based surface potential measurements with electrochemical potential measurements made in bulk electrolytes, and helps establish the value and usefulness ...

This method has two main advantages over physical scanning: it requires fewer measurements and results in uniform enhancement of the resolution over the entire sample plane.

Renesas Electronics Corporation announced the RX21A Group of 32-bit microcontrollers (MCUs) for smart meters with advanced functionality.

Luna's new CHISL technology concept to provide critical measurements previously unmeasurable in oil & gas operations.

Low Landing Energy: The landing energy of the electron beam is carefully controlled to minimize sample charging and damage, ensuring accurate measurements. Advanced Electron Optics: CD-SEM systems ...

The measurements required high spatial resolution and high signal-to-noise ratios, and the experimental efforts required to achieve this are discussed in detail. A set of parametric investigations was ...

For example, resolution of arteriographic and US linear measurements is about 0.2 mm. A 60%S could render the following extreme measurements for a 5 mm vessel diameter: 54%S (2.8/5.2) or 67%S (3.2 ...

Innovative microscopy technology improves measurement of heat flow in materials, crucial for developing efficient thermoelectric devices and energy systems.

By underpinning its audience and outcomes measurement products with this ID resolution approach, Nielsen is ensuring its products have the flexibility to adjust to ongoing technology and regulatory ...