At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

Read more about meeting the individual challenges of digital zero-defect testing and details of approaches to dealing with these challenges. The effectiveness of semiconductor manufacturing test has a ...

Finding critical defects in manufacturing is becoming more difficult due to tighter design margins, new processes, and shorter process windows. Process marginality and parametric outliers used to be ...

As technology nodes shrink, end users are designing systems where each chip element is being targeted for a specific technology and manufacturing node. While designing chip functionality to address ...

To allow faster time-to-market and more complete testing of complex digital devices for new automobiles, EDA market leader Cadence Design Systems Inc. and automatic test equipment supplier Advantest ...