Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

Part four explains how to use breakpoints, event triggers, and program traces to debug code. Part six reviews the common bugs found in DSP applications, and outlines the different testing methods ...

The tips and tricks when testing motor-driver ICs on the lab bench can help engineers reduce time spent on evaluating and prototyping motor systems. The first installment of this two-part article ...

Single die packages and products have been the norm for decades. Moreover, so has multi-chip modules (MCMs) or system in package (SiP) for quite some time. Understandably, with ASICs and SoCs becoming ...

Troubleshooting communications test systems can be made easier if the hardware and software development are separated from each other. Problems can be more readily found and corrected by following ...

The JavaScript-based platform allows developers to do remote testing and debugging on a Windows Phone through Internet Explorer 10. Web developers know that although testing and debugging an ...

Modern multithreaded, asynchronous code can be hard to debug. The complexity that comes with message passing and thread management results in bugs that can seem non-determinant, with little or no way ...